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A phase space model of Fourier ptychographic microscopy
2014
Optics Express
A new computational imaging technique, termed Fourier ptychographic microscopy (FPM), uses a sequence of low-resolution images captured under varied illumination to iteratively converge upon a high-resolution complex sample estimate. Here, we propose a mathematical model of FPM that explicitly connects its operation to conventional ptychography, a common procedure applied to electron and X-ray diffractive imaging. Our mathematical framework demonstrates that under ideal illumination conditions,
doi:10.1364/oe.22.000338
pmid:24514995
pmcid:PMC3926543
fatcat:mlaf4sahwbcnjnechtz5knxe7a