Effects of Annealing Temperature and Gas on Pentacene OTFTs With HfLaO as Gate Dielectric

L. F. Deng, Y. R. Liu, H. W. Choi, J. P. Xu, C. M. Che, P. T. Lai
2012 IEEE transactions on device and materials reliability  
doi:10.1109/tdmr.2011.2169797 fatcat:cgzd47tuffcurin3hphyag42t4