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Hardware cybersecurity has become a key issue, especially for very large integrated circuits. If counterfeit, forged, or defective ICs present a significant threat to system reliability and security. The growing complexity of digital and mixed-signal systems makes it increasingly challenging yet vital to develop robust methods to assess and confirm the reliability and authenticity of ICs. We introduce a new terahertz testing method for non-destructive and unobtrusive identification ofdoi:10.1109/access.2021.3075429 doaj:b941f5e9bd66481f8f171ee68b77ef48 fatcat:3fzwlweswzahbht2334v3enija