Optical force microscopy: combining light with atomic force microscopy for nanomaterial identification

Nusrat Jahan, Hanwei Wang, Shensheng Zhao, Arkajit Dutta, Hsuan-Kai Huang, Yang Zhao, Yun-Sheng Chen
2019 Nanophotonics  
Scanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information. In this review, we discuss recent advances in scanning probe techniques that capitalize on light-induced forces for studying nanomaterials down to molecular specificities with nanometer spatial resolution.
doi:10.1515/nanoph-2019-0181 fatcat:hxa2oigoanfilcginj5x2j3lre