Improved image accuracy in Hot Pixel degraded digital cameras

Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren
2013 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)  
doi:10.1109/dft.2013.6653602 dblp:conf/dft/ChapmanTKK13 fatcat:454rx2l32vh4jfpdmypoot3wvm