Robust test generation for power supply noise induced path delay faults

Xiang Fu, Huawei Li, Yu Hu, Xiaowei Li
2008 2008 Asia and South Pacific Design Automation Conference  
In deep sub-micron designs, the delay caused by power supply noise (PSN) can no longer be ignored. A PSNinduced path delay fault (PSNPDF) model is proposed in this paper, and should be tested to enhance chip quality. Based on precise timing analysis, we also propose a robust test generation technique for PSNPDF. Concept of timing window is introduced into the PSNPDF model. If two devices in the same feed region simultaneously switch in the same direction, the current waveform of the two devices
more » ... will have an overlap and excessive PSN will be produced. Experimental results on ISCAS'89 circuits showed test generation can be finished in a few seconds.
doi:10.1109/aspdac.2008.4484033 dblp:conf/aspdac/FuLHL08 fatcat:zkmmlyrgqfbtpf57gzlj3zfzee