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Error Detection and Recovery Techniques for Variation-Aware CMOS Computing: A Comprehensive Review
2011
Journal of Low Power Electronics and Applications
While Moore's law scaling continues to double transistor density every technology generation, new design challenges are introduced. One of these challenges is variation, resulting in deviations in the behavior of transistors, most importantly in switching delays. These exaggerated delays widen the gap between the average and the worst case behavior of a circuit. Conventionally, circuits are designed to accommodate the worst case delay and are therefore becoming very limited in their performance
doi:10.3390/jlpea1030334
fatcat:5hwevwjj2fbzvaeume46u7nuom