Nanoscale dielectric microscopy of non-planar samples by lift-mode electrostatic force microscopy

M Van Der Hofstadt, R Fabregas, M C Biagi, L Fumagalli, G Gomila
2016 Nanotechnology  
doi:10.1088/0957-4484/27/40/405706 pmid:27597315 fatcat:kam7mcvwcvakniaawz2oldcy54