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Analog circuits specification driven testing by the means of digital stream and non-linear estimation model optimized evolutionarily
2020
unpublished
The method described in this work allows to determine the optimal distribution of pulses of digital signal as well as the non-linear mathematical model based on a multiple regression statistical analysis, which are specialized to an effective and low-cost testing of functional parameters in analog electronic circuits. The aim of this concept is to simplify the process of analog circuit specification validation and minimize hardware implementation, time and memory requirements during the testing
doi:10.24425/bpasts.2020.135390
fatcat:pk2voxjrmjdsfigtfw4wipf6q4