A DfT Architecture and Tool Flow for 3-D SICs With Test Data Compression, Embedded Cores, and Multiple Towers

Christos Papameletis, Brion Keller, Vivek Chickermane, Said Hamdioui, Erik Jan Marinissen
2015 IEEE design & test  
doi:10.1109/mdat.2015.2424422 fatcat:36q7xllvbzdupcbgv2gjqegpty