A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2022; you can also visit the original URL.
The file type is application/pdf.
21pXA-9 SiO_2/Si(100) 界面近傍における余剰 Si 点欠陥の安定性
Stability of excess Si defects near SiO_2/Si(100) interfaces
2003
Meeting Abstracts of the Physical Society of Japan (Nihon Butsuri Gakkai koen gaiyoshu)
Stability of excess Si defects near SiO_2/Si(100) interfaces
Preserved Fulltext
