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Resource-constrained system-on-a-chip test: a survey
2005
IEE Proceedings - Computers and digital Techniques
Manufacturing test is a key step in the implementation flow of modern integrated electronic products. It certifies the product quality, accelerates yield learning and influences the final cost of the device. With the ongoing shift towards the core-based system-on-a-chip (SOC) design paradigm, unique test challenges, such as test access and test reuse, are confronted. In addition, when addressing these new challenges, the SOC designers must consciously use the resources at hand, while keeping
doi:10.1049/ip-cdt:20045019
fatcat:6ofceww26veufioqaq2wjhpnem