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For anti-fuse or flash-memory-based field-programmable gate arrays (FPGAs), single-event transient (SET)-induced faults are significantly more pronounced than single-event upsets (SEUs). While most existing work studies SEU, this paper proposes a retiming algorithm for mitigating variational SETs (i.e., SETs with different durations and strengths). Considering the reshaping effect of an SET pulse caused by broadening and attenuation during its propagation, SET-aware retiming (SaR) redistributesdoi:10.1109/tcsi.2010.2094370 fatcat:mgl6tyxzcfa57h3upkz6tkpjue