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Obtaining Statistically Random Information From Silicon Physical Unclonable Functions
2014
IEEE Transactions on Emerging Topics in Computing
Silicon physical unclonable functions (PUFs) utilize the variation during silicon fabrication process to extract information that will be unique for each chip. There have been many recent approaches to how PUF can be used to improve security-related applications. However, it is well known that the fabrication variation has very strong spatial correlation 1 and this has been pointed out as a security threat to silicon PUF. In fact, when we apply NIST's statistical test suite for randomness
doi:10.1109/tetc.2014.2316497
fatcat:7tz3wsggjndt3kqc7eojhvxrti