Analysis of recent secure scan test techniques

Xing Cheng, Sungju Park
2016 2016 Chinese Control and Decision Conference (CCDC)  
Side channel attack may result in user key leakage as scan test techniques are applied for cryptographic chips. Many secure scan designs have been proposed to protect the user key. This paper meticulously selects three current scan test techniques, analyses their advantages and disadvantages and also compares them in security and area overhead. Users can choose one of them according to the requirements and further combination can be implemented to achieve better performance.
doi:10.1109/ccdc.2016.7532082 fatcat:eelphb3aibatrmrmglpj46otei