Conventional microanalytical techniques (Optical Microscopy OM, Scanning Electron Microscopy SEM, Electron Probe Micro Analysis EPMA) were used in combination with new techniques (Secondary Ion Mass Spectrometry SIMS and Nuclear Microprobe NM) to visualise and identify unknown phases in ternary and quaternary AI-Li alloys. The limitations of each technique are compensated by the unique advantages of the others : spatial resolution, qualitative and quantitative analysis of light elements such as

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... Li. Finally, the Nuclear Microprobe may be considered as a reference method by providing standard samples on which correction procedures for the quantitative analysis of light elements by conventional techniques (SEM and EPMA) can be tested and implemented. Article published online by EDP Sciences and available at http://dx.