Measurement of Multi-Port S-Parameters using Four-Port Network Analyzer

Jongmin Kim, Duc Long Luong, Wansoo Nah, SoYoung Kim
2013 JSTS Journal of Semiconductor Technology and Science  
An efficient measurement methodology is proposed to construct the scattering parameters of a multi-port device using a four-port vector network analyzer (VNA) without the external un-terminated ports. By using the four-port VNA, the reflected waves from the un-terminated ports could be minimized. The proposed method significantly enhances the accuracy of the S-parameters with less number of measurements compared to the results of classical renormalization technique which uses twoport VNA. The
more » ... twoport VNA. The proposed method is validated from the measured data with the coupled 8-port micro-strip lines.
doi:10.5573/jsts.2013.13.6.589 fatcat:yrbgnfuz2ja7vowhr5eiu3gemy