We propose and analyze a new approach based on parity-time (PT) symmetric microcavities with balanced gain and loss to enhance the performance of cavity-assisted metrology. We identify the conditions under which PT-symmetric microcavities allow to improve sensitivity beyond what is achievable in loss-only systems. We discuss its application to the detection of mechanical motion, and show that the sensitivity is significantly enhanced in the vicinity of the transition point from unbroken- to

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... en-PT regimes. We believe that our results open a new direction for PT-symmetric physical systems and it may find use in ultra-high precision metrology and sensing.