A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2016; you can also visit the original URL.
The file type is
Statistical circuit simulation is exhibiting increasing importance for circuit design under process variations. Existing approaches cannot efficiently analyze the failure probability for circuits with a large number of variation, nor handle problems with multiple disjoint failure regions. The proposed rare event microscope (REscope) first reduces the problem dimension by pruning the parameters with little contribution to circuit failure. Furthermore, we applied a nonlinear classifier which isdoi:10.1145/2593069.2593202 dblp:conf/dac/WuXKCH14 fatcat:7m6zsvx4xff27a2ezxsnhdo7ii