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Noise Measurement of Semiconductor Lasers
半導体レーザーの雑音測定
1991
The Review of Laser Engineering
半導体レーザーの雑音測定
Preserved Fulltext
Generating mechanisms and measuring methods of the intensity noise and the frequency noise of semiconductor lasers are reviewed. Both types of noise originates from the field flucturation inherent in the spontaneous emission which works as a source of a lasing field. The noise level and its property are determined with lasing mechanism and related physics. Several topics on the noise problem are also shown presented.
doi:10.2184/lsj.19.8_756
fatcat:3laktdlpcza2xpew5c4przz3um