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VIP---an input pattern generator for indentifying critical voltage drop for deep sub-micron designs
1999
Proceedings of the 1999 international symposium on Low power electronics and design - ISLPED '99
We present a novel input pattern generator for dynamic power network simulation. The obtained patterns successfully identify critical voltage drop areas for a set of industrial designs, which are difficult to be found using functional vectors. The search engine of the pattern generator for worst-case IR voltage drop is based on the multiobjective genetic algorithm. To achieve high coverage for critical voltage drop cells, we propose to model the search criteria into the maximum weighted
doi:10.1145/313817.313905
dblp:conf/islped/JiangYC99
fatcat:66utw62glfhytjnxb7maicnyoy