Atomic-scale characterization of hydrogenated amorphous-silicon films and devices. Annual subcontract report, 15 April 1994--14 March 1998 [report]

A. Gallagher, S. Barzen, M. Childs, A. Laracuente
1998 unpublished
doi:10.2172/654022 fatcat:ldqsniyoljdvpmx2rtuurgnyxq