Temperature controlled measurement system for precise characterization of electronic circuits and devices

Pablo Aguirre, Conrado Rossi-Aicardi
2014 2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings  
A temperature controlled oven, with provisions for easy connection of instruments to the device under test, was designed and built. This paper describes the oven, its thermal model and control system and presents measurement results with different temperature profiles. An NTC thermistor measures the system temperature and a modified Steinhart & Hart equation is used to convert resistance readings to temperature. The system is capable of setting its temperature from just over ambient temperature
more » ... ambient temperature up to 375 K (around 102 ∘ C). Temperature stability is ultimately limited by the resolution of temperature measurement to ±2 mK.
doi:10.1109/i2mtc.2014.6860994 dblp:conf/i2mtc/AguirreR14 fatcat:26z46z6qhnfx3hrsf2e34ec6ee