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Frequency dependences of dielectric loss tangent tanδ (f) and Cole-Cole diagram of thin films of silver sulfide at various temperatures in the range 0-200 ° C were studied. A comparison of experimental data with the results of calculation of electrical circuit complex impedance of Ag2S samples is made. The comparison is made for temperatures before and after semiconductor-superionic phase transition. Based on the analysis of experimental results and literature data, a microscopic model of thedoi:10.21883/ftt.2020.12.50218.152 fatcat:ep2bx6w6yzbdznc6rf2ggaovdy