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2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
This paper proposes an isolated component accelerated lifetime testing of high-voltage SSL driver. In this method, the most critical component(s) will be isolated from the rest, and critical stress will be applied to these components to estimate the lifetime. Although circuit modification is unavoidable, this testing method can minimize failure interactions between components and testing duration for the system. Thus, compared to the conventional accelerated testing method, this method coulddoi:10.1109/eurosime.2013.6529911 fatcat:2ty6vyd5jnf2vapqcs43wee6lu