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Reliability mechanisms for very large storage systems
20th IEEE/11th NASA Goddard Conference on Mass Storage Systems and Technologies, 2003. (MSST 2003). Proceedings.
Reliability and availability are increasingly important in large-scale storage systems built from thousands of individual storage devices. Large systems must survive the failure of individual components; in systems with thousands of disks, even infrequent failures are likely in some device. We focus on two types of errors: nonrecoverable read errors and drive failures. We discuss mechanisms for detecting and recovering from such errors, introducing improved techniques for detecting errors in
doi:10.1109/mass.2003.1194851
dblp:conf/mss/XinMSLBL03
fatcat:cystlukppvftzmtw6qlmkwsosq