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IEEE Sensors Journal
High-resolution wavefront control for adaptive optics requires accurate sensing of a measure of optical quality. We present two analog very-large-scale-integration (VLSI) image-plane sensors that supply real-time metrics of image and beam quality, for applications in imaging and line-of-sight laser communication. The image metric VLSI sensor quantifies sharpness of the received image in terms of average rectified spatial gradients. The beam metric VLSI sensor returns first and second orderdoi:10.1109/jsen.2002.807298 fatcat:tmdtrrlxurc63er2bb3wtnabtu