LOW DOSE RATE EFFECTS IN SILICON BASED DEVICES AND INTEGRATED CIRCUITS: A REVIEW

K. I. Tapero
2018 Izvestiya Vysshikh Uchebnykh Zavedenii Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering  
doi:10.17073/1609-3577-2016-1-5-21 fatcat:44zg6csrsja4plnnqefvtahdyy