A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2020; you can also visit the original URL.
The file type is application/pdf.
Detection of homogeneous production batches of semiconductor devices by greedy heuristic clustering algorithms with special distance metrics
2020
IOP Conference Series: Materials Science and Engineering
Preserved Fulltext
Authors present a comparative efficiency analysis of application of k-means and kmedoids clustering models for solving the problem of grouping of semiconductor devices into homogeneous production batches using three types of metrics: Euclidean distance, Mahalanobis distance, Manhattan distance.
doi:10.1088/1757-899x/734/1/012104
fatcat:miaxycbnfndpnd6vxvkm6zpx3y