Detection of homogeneous production batches of semiconductor devices by greedy heuristic clustering algorithms with special distance metrics

G Sh Shkaberina, I P Rozhnov, V P Popov, L A Kazakovtsev, E V Lapunova
2020 IOP Conference Series: Materials Science and Engineering  
Authors present a comparative efficiency analysis of application of k-means and kmedoids clustering models for solving the problem of grouping of semiconductor devices into homogeneous production batches using three types of metrics: Euclidean distance, Mahalanobis distance, Manhattan distance.
doi:10.1088/1757-899x/734/1/012104 fatcat:miaxycbnfndpnd6vxvkm6zpx3y