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Improving the quantification at high spatial resolution using a field emission electron microprobe
2014
IOP Conference Series: Materials Science and Engineering
Quantification of low concentration elements using soft X-rays at high spatial resolution P T Pinard and S Richter -Electron probe microanalysis of Ni-silicides at low voltage: difficulties and possibilities E. Heikinheimo et al -This content was downloaded from IP address 207.241.231.83 on 25/07 Abstract. The capabilities of field emitter electron microprobes to perform quantitative measurements at high spatial resolution are discussed. Using Fe-Cr-C particles in a bearing steel (SAE 52100) as
doi:10.1088/1757-899x/55/1/012016
fatcat:p57h7hicejb67ep2io47qys6um