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Multi-Layer Test and Diagnosis for Dependable NoCs
2015
Proceedings of the 9th International Symposium on Networks-on-Chip - NOCS '15
Networks-on-chip are inherently fault tolerant or at least gracefully degradable as both, connectivity and amount of resources, provide some useful redundancy. These properties can only be exploited extensively if test and diagnosis techniques support fault detection and error containment in an optimized way. On the one hand, all faulty components have to be isolated, and on the other hand, remaining fault-free functionalities have to be kept operational. In this contribution, behavioral
doi:10.1145/2786572.2788708
dblp:conf/nocs/WunderlichR15
fatcat:zvlo6ygotra7vntppzscykshiu