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We describe the layout and the capabilities of a new aberration-corrected low-energy electron microscopy (LEEM) and photoemission electron microscopy (PEEM) facility, which features real-and reciprocal-space spectroscopy. This new setup, named Electronic, Structural, and Chemical Nanoimaging in Real Time (ESCHER), was recently installed at Leiden University. It has three major instrumentation-related goals. First, we aim to reach the ultimate spatial resolution facilitated by aberrationdoi:10.1147/jrd.2011.2150691 fatcat:jgop63bumvdypetjp57s2ctpzi