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Ellipsometric and Spectrometric Studies of (Ga0.2In0.8)2Se3 Thin Film
2020
Ukrainian Journal of Physics
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Thermal evaporation technique is used to deposite (Ga0,2In0,8)2Se3 thin films. The refractive index and extinction coefficient dispersions are obtained from the spectral ellipsometry measurements. The dispersion of the refractive index is described in the framework of the Wemple–Di Domenico model. The optical transmission spectra of a (Ga0,2In0,8)2Se3 thin film are studied in the temperature range 77–300 K. The temperature behavior of the Urbach absorption edge, as well as the temperature
doi:10.15407/ujpe65.3.231
fatcat:fmdlveog7fhjpfn33zm4kmb5cm