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The NBTI Impact on RF Front End in Wireless Sensor Networks
2009
2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis
The life time of RF front end in Wireless Sensor Networks (WSN) is so important that it decides whether the whole system can work normally for a long time. Under CMOS technology, Negative Bias Temperature Instability (NBTI) is one of the most important factors that decide chips' life time. Especially with the feature size declining, NBTI effect is becoming more and more serious. Previous works mainly focus on NBTI effect at device level, or NBTI effect in large-scale digital circuits. In this
doi:10.1109/cas-ictd.2009.4960893
fatcat:hfu2ubpazfcnfjsy2szcp44z6a