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This paper describes a simple method to fabricate silicon microtips with integrated self-aligned polarization electrodes for development of MEMS and electron field emission devices. The method is based on the wet bulk micromachining of the silicon substrate in KOH solutions and utilizes low stress PECVD SiOxNy films obtained at low temperatures (320°C) as structural material for both mechanical support and electrical insulation of the electrodes. For the electrodes sputtered Cr films weredoi:10.29292/jics.v3i2.288 fatcat:tt3w7koa7vgsdpppoxlv5otm5i