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Zinc selenide (ZnSe) thin films were deposited on to chemically and ultrasonically cleaned glass substrates at different substrate temperatures from room temperature to 200C keeping the thickness fixed at 300 nm by using thermal evaporation method in vacuum. The structural properties of the films were ascertained by X-ray diffraction (XRD) method utilizing a diffractometer. The optical properties were measured in the photon wavelength ranging between 300 and 2500 nm by using a UV-VIS-NIRdoi:10.3329/jbas.v36i2.12969 fatcat:bxrp5b3fzvfqtmn7nis5e4sbwq