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Frontiers of in situ electron microscopy
2015
MRS bulletin
In situ transmission electron microscopy (TEM) has become an increasingly important tool for materials characterization. It provides key information on the structural dynamics of a material during transformations and the ability to correlate a material's structure and properties. With the recent advances in instrumentation, including aberration-corrected optics, sample environment control, the sample stage, and fast and sensitive data acquisition, in situ TEM characterization has become more
doi:10.1557/mrs.2014.305
fatcat:zla7qjdzo5c27nkvhy4njrkvky