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The defect morphology is an essential aspect of the evolution of crystals' microstructure and its response to stress. Existing methods either only report defect concentration or characterize only some of the defect morphologies. The need for an efficient and comprehensive algorithm to study defects is becoming more evident with the increase in the amount of simulation data and improvements in data-driven algorithms. We present a method to characterize a defect's morphology precisely by reducingarXiv:2009.14147v2 fatcat:ncyuh66cmzhpzplyzjxk32wgia