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A subKelvin scanning probe microscope for the electronic spectroscopy of an individual nano-device
2012
Review of Scientific Instruments
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We present a combined scanning force and tunneling microscope working in a dilution refrigerator that is optimized for the study of individual electronic nano-devices. This apparatus is equipped with commercial piezo-electric positioners enabling the displacement of a sample below the probe over several hundred microns at very low temperature, without excessive heating. Atomic force microscopy based on a tuning fork resonator probe is used for cryogenic precise alignment of the tip with an
doi:10.1063/1.4769258
pmid:23277991
fatcat:l2cbdvryvzgnpoo5xxhu3puiwu