A subKelvin scanning probe microscope for the electronic spectroscopy of an individual nano-device

T. Quaglio, F. Dahlem, S. Martin, A. Gérardin, C. B. Winkelmann, H. Courtois
2012 Review of Scientific Instruments  
We present a combined scanning force and tunneling microscope working in a dilution refrigerator that is optimized for the study of individual electronic nano-devices. This apparatus is equipped with commercial piezo-electric positioners enabling the displacement of a sample below the probe over several hundred microns at very low temperature, without excessive heating. Atomic force microscopy based on a tuning fork resonator probe is used for cryogenic precise alignment of the tip with an
more » ... idual device. We demonstrate the local tunneling spectroscopy of a hybrid Josephson junction as a function of its current bias.
doi:10.1063/1.4769258 pmid:23277991 fatcat:l2cbdvryvzgnpoo5xxhu3puiwu