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This paper presents a calibrated four-channel measurement system for the characterization of nonlinear RF devices such as power amplifiers. The main goal of this study is to perform the characterization of the bandpass response of a nonlinear device-under-test (DUT) driven by modulated carriers. The proposed setup enables the generation of -o r -band (1-4 GHz) carriers with a modulation bandwidth up to 100 MHz. The carrier harmonics generated by the nonlinear DUT are ignored and considered todoi:10.1109/tmtt.2006.879169 fatcat:fjcedquixvds5hytudfo7uayvq