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The offset of an ADC is one of the main limitations for interleaved architectures. The method proposed here enables a precise measurement of the offset while the ADC operates and introduces a minimum disturb to the output result. The method exploits a random modulation by +1 or -1 of the input signal. The modulating signal is the wide-band output of a Chua circuit passed through a comparator. The resulting spread spectrum can be easily distinguished by the dc offset and reconstructed in thedoi:10.1109/ecctd.2005.1522969 dblp:conf/ecctd/CabriniM05 fatcat:6jscwzenk5gn7ewekzcwzg3d2u