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Fault-simulation based design error diagnosis for sequential circuits
1998
Proceedings of the 35th annual conference on Design automation conference - DAC '98
This paper addresses the problem of locating design errors in a sequential circuit. For single-error circuits, we consider a signal f as a potential error source only if the circuit can be completely rectified by re-synthesizing f (i.e., changing the function of signal f). In order to handle larger circuits, we do not rely on Binary Decision Diagram. Instead, we search for potential error sources by a modified sequential fault simulation process. The main contributions of this paper are
doi:10.1145/277044.277207
dblp:conf/dac/HuangCCL98
fatcat:6kitkgqf6van7o4whq5nn52vqu