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Challenges and Solutions in Emerging Memory Testing
2017
IEEE Transactions on Emerging Topics in Computing
The research and prototyping of new memory technologies are getting a lot of attention in order to enable new (computer) architectures and provide new opportunities for today's and future applications. Delivering high quality and reliability products was and will remain a crucial step in the introduction of new technologies. Therefore, appropriate fault modelling, test development and design for testability (DfT) is needed. This paper overviews and discusses the challenges and the emerging
doi:10.1109/tetc.2017.2691263
fatcat:isbxwhpr3jatngjet2jc3r2m5e