Dual Ion Beam Irradiation System for In situ Observation with Electron Microscope
透過電子顕微鏡その場観察用二重イオン照射装置

Tetuo TSUKAMOTO, Kiiti HOJOU, Sigemi FURUNO, Hitosi OTSU, Kazuhiko IZUI
1993 Shinku  
doi:10.3131/jvsj.36.603 fatcat:ffdnxmmftrawlkizgfjkz34iga