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Reliability is quickly becoming a primary design constraint for high end processors because of the inherent limits of manufacturability, extreme miniaturization of transistors, and the growing complexity of large multicore chips. To achieve a high degree of fault tolerance, we need to detect faults quickly, and try to rectify them. In this paper, we focus on the former aspect. We present a survey of different kinds of fault detection mechanisms for processors at the circuit, architecture, anddoi:10.1145/2501654.2501662 fatcat:rmmc2ntqofgkvnbjhwpmekol4i