A copy of this work was available on the public web and has been preserved in the Wayback Machine. The capture dates from 2017; you can also visit the original URL.
The file type is
Near-field microscopy has been developed to characterize optical properties of materials below the diffraction limit. It consists of scanning a probe, which can be of atomic dimensions, a few nanometers above a material surface, and detecting electromagnetic interaction. The resulting near-field optical images are conventionally analyzed by means of Fourier based methods although these data are nonstationary. This observation suggests that timefrequency analysis is potentially a powerful tooldoi:10.1109/icassp.2001.940612 dblp:conf/icassp/BarchiesiR01 fatcat:d6677q4dmbgzrpbllur4ije6wm