Robust C-element design for soft-error mitigation

I-Chyn Wey, Bing-Chen Wu, Chien-Chang Peng, Cihun-Siyong Alex Gong, Chang-Hong Yu
2015 IEICE Electronics Express  
C-element is a widely used component in soft-error tolerant designs to construct a robust soft-tolerant mechanism; however, C-element itself is not a robust device. In this paper, we proposed a robust C-element design by employing two transistors operating in saturation region parallel connected with C-element upper pMOS and lower nMOS to enhance its softerror tolerance. By utilizing the proposed C-element in the prior-art isolated latch designs, the maximum soft error tolerance can be improved by 25.87% as compared with conventional C-element.
doi:10.1587/elex.12.20150268 fatcat:5vj7ckj6rvg3hpvfcacgez33um