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Advancements in technology enable integration of a large number of cores on a single silicon die. At the same time, aggressive technology scaling has an ever-increasing adverse impact on the lifetime reliability of such large integrated circuits. In this work, we model the lifetime reliability of homogeneous manycore systems using a load-sharing nonrepairable k-out-of-n:G system with general failure distributions for embedded cores. In manycore systems, an embedded core can be in operational,doi:10.1109/prdc.2008.23 dblp:conf/prdc/HuangX08 fatcat:xe2y4t7sozbclfkcbj7tbml3qi