Atom Probe Tomography Characterization of a White Etching Area in a Bearing Steel

J. Kang, C. Williams, B. Hosseinkhani, P.E. Rivera Diaz del Castillo, P.A. Bagot, M.P. Moody
2013 Microscopy and Microanalysis  
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
doi:10.1017/s1431927613007071 fatcat:nohctrdtszaard2g6openismnq