Note: Seesaw actuation of atomic force microscope probes for improved imaging bandwidth and displacement range

H. Torun, D. Torello, F. L. Degertekin
2011 Review of Scientific Instruments  
Comment on "Print your atomic force microscope" [Rev. Sci. Instrum. 78, 075105 (2007)] Rev. Sci. Instrum. 83, 037101 (2012) Dynamics of surface-coupled microcantilevers in force modulation atomic force microscopy -magnetic vs. dither piezo excitation J. Appl. Phys. 111, 054303 (2012) Quantitative comparison of two independent lateral force calibration techniques for the atomic force microscope Rev. Sci. Instrum. 83, 023707 (2012) Constant tip-surface distance with atomic force microscopy via
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doi:10.1063/1.3622748 pmid:21895282 fatcat:w5wp2rrgxnhf5ndzepff4jmjku