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Comment on "Print your atomic force microscope" [Rev. Sci. Instrum. 78, 075105 (2007)] Rev. Sci. Instrum. 83, 037101 (2012) Dynamics of surface-coupled microcantilevers in force modulation atomic force microscopy -magnetic vs. dither piezo excitation J. Appl. Phys. 111, 054303 (2012) Quantitative comparison of two independent lateral force calibration techniques for the atomic force microscope Rev. Sci. Instrum. 83, 023707 (2012) Constant tip-surface distance with atomic force microscopy viadoi:10.1063/1.3622748 pmid:21895282 fatcat:w5wp2rrgxnhf5ndzepff4jmjku